GENETICAL ANALYSIS OF SOME QUANTITATIVE COMPONENTS OF YIELD IN BREADWHEAT
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Abstract
Absence of epistasis was noticed in some cross combinations between semidwarf/dwarf and tall wheats for grain yield per plant, ear length and grains/ear. Duplicate epistasis of additive x dominance interaction was involved for plant height and 1000-grain weight in some crosses. However, plant height and grain weight per ear was governed by additive x additive gene action in one cross, while it was due to dominance x dominance gene interaction in other cross.
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How to Cite
AMAWATE, J. S., & BEHL, P. N. (1995). GENETICAL ANALYSIS OF SOME QUANTITATIVE COMPONENTS OF YIELD IN BREADWHEAT. INDIAN JOURNAL OF GENETICS AND PLANT BREEDING, 55(02), 120–125. https://doi.org/.
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Research Article

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