Genetic analysis for spot blotch (Bipolaris sorokiniana Sacc. In Genetic analysis in wheat [Triticum aestivum (L.) Em. TheiL]

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Prashant Geel
Sehan Pal
Swati
J. P. Jaiswal

Abstract

Wheat is the most important cereal crop after rice. India is one of the major producers of wheat and occupies second place after China in terms of area and production among wheat growing countries of the world. However, wheat crop production is constrained by a number of diseases. Among these diseases, spot blotch (Bipolaris sorokiniana Sacco In Borak. Shoem.) is of increasing concern in India and other countries of South East Asia due to its wide spread prevalence and increasing severities [1]. Spot blotch may yield loss between 20 and 80 per cent [2]. Therefore, in order to stabilize the higher productivity, it is important to develop resistant varieties. The success of the resistance breeding programme lies in the sound knowledge of genetic behaviour of the resistance genes. Hence, the present investigation was carried out to obtain the estimates of gene effects in resistance varieties namely, PBW 343, PBW 373 and WH 581.

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How to Cite
Geel, P., Pal, S., Swati, & Jaiswal, J. P. (2005). Genetic analysis for spot blotch (Bipolaris sorokiniana Sacc. In Genetic analysis in wheat [Triticum aestivum (L.) Em. TheiL]. INDIAN JOURNAL OF GENETICS AND PLANT BREEDING, 65(04), 305–306. https://doi.org/.
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Research Article