Gene effects for grain yield and related traits in sorghum [Sorghum bicolor (L.) Moench]
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Abstract
Generation mean analysis was carried out to estimate the nature and magnitude of gene effects in sorghum [Sorghum bicolor (L.) Moench]. Inadequacy of simple additive-dominance model reflected the presence of epistatic interaction. Ail the four traits In majority of crosses were under the influence of dominance gene effects. Higher magnitude of dominance and dominance x dominance gene interactions could not be exploited in the crosses with duplicate epistasis as it minimizes the expression of heterosis. Reciprocal recurrent selection and/or biparental mating in early segregating generations can prove to be an effective approach for development of high yielding sorghum varieties.
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How to Cite
Narain, V., Singh, P. K., Kumar, N., & Singh, V. S. (2007). Gene effects for grain yield and related traits in sorghum [Sorghum bicolor (L.) Moench]. INDIAN JOURNAL OF GENETICS AND PLANT BREEDING, 67(01), 34–36. https://doi.org/.
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Research Article
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