Anjaneya, G. Girish, Ashok Badigannavar, S. Muniswamy, L. N. Yogeesh, S. K. Jayalaxmi, A. M. Talwar, Vikas Kulkarni, and T. R. Ganapathi. “Stability Analysis of Grain Yield and Its Contributing Traits in Advanced Mutant Lines of Sorghum [Sorghum Bicolor (L.) Moench]”. INDIAN JOURNAL OF GENETICS AND PLANT BREEDING 80, no. 04 (December 25, 2020): 471–474. Accessed August 4, 2025. https://www.isgpb.org/journal/index.php/IJGPB/article/view/409.