ANJANEYA; GIRISH, G.; BADIGANNAVAR, A.; MUNISWAMY, S.; YOGEESH, L. N.; JAYALAXMI, S. K.; TALWAR, A. M.; KULKARNI, V.; GANAPATHI, T. R. Stability analysis of grain yield and its contributing traits in advanced mutant lines of sorghum [Sorghum bicolor (L.) Moench]. INDIAN JOURNAL OF GENETICS AND PLANT BREEDING, [S. l.], v. 80, n. 04, p. 471–474, 2020. DOI: 10.31742/IJGPB.80.4.14. Disponível em: https://www.isgpb.org/journal/index.php/IJGPB/article/view/409. Acesso em: 4 aug. 2025.