KANNABABU, N.; RAKSHIT, S.; MADHUSUDHANA, R.; TONAPI, V. A.; DAS, I. K.; RAGHUNATH, K. Identification of superior parental lines for seed quality and storability through GGE biplot analysis of line × tester data in grain sorghum. INDIAN JOURNAL OF GENETICS AND PLANT BREEDING, [S. l.], v. 77, n. 02, p. 278–286, 2017. DOI: 10.5958/0975-6906.2017.00037.2. Disponível em: https://www.isgpb.org/journal/index.php/IJGPB/article/view/128. Acesso em: 10 jul. 2025.