Indian Society of Genetics & Plant Breeding

Yield stability analysis in advanced durum wheat genotypes by using AMMI and GGE biplot models under diverse environment

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A investigation was carried out to ascertain the GEI, the
yield stability and adaptability of 17 advanced durum wheat
genotypes (G) in four environments over two crop years
(2011-12 and 2012-13) under rainfed and supplementary
irrigation (IRR) conditions. Combined analysis of variance
showed that environmental factor and GEI explained 70%
and 10.71% of total sum squares, respectively. The AMMI
and GGE biplot model were used to study the nature of GEI
on the grain yield. First and second component of AMMI
model totally explained 90.73% of GEI variations. Results
of GGEbiplot model similar to the results of AMMI model
showed that the G12 with the environment of IRR2, G2
with the environment of RA2 and G17 and G9 with the
environment of RA1 and IRR1, respectively showed a special
adaptability. G8 and G11 could be recommended for all
environments. Considering both graphical analysis models
of AMMI and GGEbiplot could be recommended. The ideal
environment, according to AMMI model, was RA2, while
GGEbiplot model represented IRR2 as ideal environment.
The results indicated that AMMI and GGEbiplot are
facilitated visual comparison and informative methods to
detect genotypes stability and in the preferential genotypes

Keywords: GEI, AMMI, GGEbiplot, durum wheat, yield stability


Year: 2016
Volume: 76
Issue: 3
Article DOI: 10.5958/0975-6906.2016.00042.0
Print ISSN: 0019-5200
Online ISSN: 0975-6906


Reza Azizinezhad info_circle
Reza Haghparast info_circle

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