Indian Society of Genetics & Plant Breeding

Inheritance studies on spot blotch of wheat caused by Bipolaris sorokiniana

Published on

Spot blotch of wheat caused by Bipolaris sorokiniana
(Sacc.) Shoem, is one of the most important disease
constraints to wheat cultivation in the north-eastern and
eastern plain zones of India. Genetics of resistance to spot
blotch was studied in seven resistant wheat lines viz.,
Chirya-3, Mayoor, Shanghai-4, Suzhoe 128-OY, Suzhoe 1-
58, Longmai and Chuanmai #18, by crossing them with
two susceptible varieties Sonalika and HD-2329. Studies
under both artificial inoculation and natural epiphytic
condition in F1, F2 and backcross generations indicated
that resistance in Chirya-3 and Mayoor is governed by two
dominant genes. The test of allelism showed that the
resistance genes in the Chirya-3 and Mayoor are allelic.
The continuous nature of frequency distribution for
AUDPC of spot blotch reaction in F2 generation involving
resistant parents of Chinese origin did not suggest any
simple Mendelian inheritance. The type of resistance
among the resistant parents of Chinese origin Shanghai-
4, Suzhoe 128-OY, Suzhoe 1-58, Longmai and Chuanmai
#18 appears to be additive with polygenic control as the
F2 populations of the susceptible x resistant crosses
exhibited different degrees of disease reaction of all
categories, viz., resistant, moderately resistant,
susceptible and highly susceptible.

Keywords: Genetics, spot blotch, resistance, Bipolaris sorokiniana, wheat


Year: 2010
Volume: 70
Issue: 3
Article DOI: N/A
Print ISSN: 0019-5200
Online ISSN: 0975-6906


S. M. S. Tomar and S. Chowdhury info_circle

Download PDF