GENETICAL ANALYSIS OF SOME QUANTITATIVE COMPONENTS OF YIELD IN BREADWHEAT

Published on Oct 01, 2019 03:04 AM

Absence of epistasis was noticed in some cross combinations between semidwarf/dwarf
and tall wheats for grain yield per plant, ear length and grains/ear. Duplicate epistasis of
additive x dominance interaction was involved for plant height and 1000-grain weight in
some crosses. However, plant height and grain weight per ear was governed by additive x
additive gene action in one cross, while it was due to dominance x dominance gene
interaction in other cross.
 

Keywords: Epistasis, additive x additive, additive x dominance, duplicate epistasis, wheat.

Info

Year: 1995
Volume: 55
Issue: 2
Article DOI: NA
Print ISSN: 0019-5200
Online ISSN: 0975-6906

Authors

J. S. AMAWATE AND P. N. BEHL info_circle

Download PDF