Three crosses of wheat, viz. CPAN 1961 X MUW 27, CPAN 1933 X HW 517 and Eagle X
Mendose, were studied for gene effects for yield and yield components. Both additive and
nonadditive gene effects were found important for various haits. Simultaneous
exploitation of these gene effects through biparental crossing followed by recurrent
selection would provide further improvement in grain yield in wheat.
Keywords: Wheat, yield components, gene effects, generation means.
Year: 1996
Volume: 56
Issue: 3
Article DOI: NA
Print ISSN: 0019-5200
Online ISSN: 0975-6906
P. K. SHARMA, D. K. GARG AND P. C. SHARMA info_circle