Indian Society of Genetics & Plant Breeding

A novel method for simultaneously estimating yield parameters and disease incidence for neck blast using half-plant panicles inoculation approach in rice (Oryza sativa L.)

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A new procedure is described to screen neck blast disease
and simultaneously evaluate for grain yield within the
same plant and estimate yield losses if any. Taking the
example for neck blast resistance, fourteen rice
L.) genotypes were evaluated for neck blast using
the "half-plant panicles inoculation approach" to check
the possibility of simultaneous screening for both yield
parameters and neck blast resistance, thus avoiding
loosing the valuable genetic material. In this approach
half the number of panicles in each of the five selected
plants of each genotype were inoculated with mixed blast
isolates and the other half of the panicles of a plants
were used as uninoculated control. The results from this
approach were then compared with two other treatments
where in all the panicles in the selected five plants were
inoculated with the mixed isolate spores and untreated
as control plants, respectively. The results indicated that
no significant difference in the yield loss between the
whole plant inoculated and whole plant uninoculated
control and yield loss between the inoculated and
uninoculated panicles of the same plant (half the number
of panicles inoculated and rest was untreated control).
This approach serves as a valuable method to
simultaneously estimate yield parameters as well as neck
blast incidence within the same plant and, thus helps to
avoid having several treatments and progeny testing in
segregating generations

Keywords: Rice, half-plant panicle inoculation, simultaneous selection, blast, grain yield


Year: 2007
Volume: 67
Issue: 1
Article DOI: NA
Print ISSN: 0019-5200
Online ISSN: 0975-6906



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