Indian Society of Genetics & Plant Breeding

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QTL mapping for heat tolerance related traits using backcross inbred lines in wheat (Triticum aestivum L.)

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Heat stress is one of the most limiting factors for the
production of wheat. Global warming and consequent
changes in climate adversely affect wheat plant growth
and yield. To elucidate genetic basis and map heat tolerance
traits, a set of 134 backcross inbred lines (BILs) derived
from the cross between WH730/*2 HD2733 was used. The
population was evaluated under late sown (LS) and very
late sown (VLS) conditions, by exposing to heat stress
during
rabi season. Positive association of normalized
difference vegetation index (NDVI), thousand grain weight
(TGW), grain weight per spike (GWS), biomass and grain
yield (GY) under both production conditions was observed.
However, canopy temperature (CT) and days to heading
(DH) showed negative correlation with GY under heat stress.
A total of 9 Quantitative trait loci (QTL) were discovered on
7 chromosomes, which includes 4 QTLs in LS and 5 QTLs
under VLS condition. Combining the results of these QTLs
revealed a major stable QTL for DH (
qDH_iari_5A) on
chromosome 5A with 23% and 26% explaining phenotypic
variance under both sowing conditions. QTL for NDVI was
detected on chromosome 1B while QTL for SL and GY on
chromosome 2A. The identified QTLs in the genomic
regions could be targeted for genetic improvement and
marker assisted selection for heat tolerance in wheat.
  

Keywords: Wheat, QTL Mapping, Heat tolerance

Info

Year: 2020
Volume: 80
Issue: 3
Article DOI: 10.31742/IJGPB.80.3.2
Print ISSN: 0019-5200
Online ISSN: 0975-6906

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